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This lab is devoted to the structural characterization of materials at the nanometer scale, performed with a versatile Transmission Electron Microscope, a FEI Tecnai G2 F20 S-TWIN, 200KV. With this tool it is possible for example to investigate the crystalline structure of the materials by HR-TEM and electron diffraction, to map the composition by EDS and EELS, to reconstruct a 3D image of the sample by tomography. |
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Techniques available TEM, HR-TEM, STEM, Diffraction, EFTEM, EDS and EELS Spectrum Imaging, Tomography. Essential specifications Point resolution (nm) 0.24 Information limit (nm) ≤ 0.15 HR STEM resolution (nm) 0.2 Cs objective (mm) 1.2 Cc objective (mm) 1.2 Focal length (mm) 1.7 Maximum eucentric tilt ± 40° Electron source - Schottky Field emitter with high maximum beam current (> 100 nA) - High probe current (> 0.6 nA in a 1 nm spot) - Small energy spread (0.7 eV@200kV or less) - Spot drift < 1 nm/minute - High short and long term stability STEM - Bright Field and Annular Dark Field mode - High sensitivity HAADF STEM detector - Magnification range 200 x - 100 Mx  |
